Instrumentation for noise measurements on CMOS transistors for fast detector preamplifiers
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L. Ratti | V. Speziali | V. Re | M. Manghisoni | L. Ratti | M. Manghisoni | V. Speziali | V. Re
[1] Raffaele Tripiccione,et al. Low-noise front-end amplifier and channel encoder for a 2-D X-ray digital imaging system with single photon counting capability , 2001 .
[2] Francesco Svelto,et al. Experimental studies of the noise properties of a deep submicron CMOS process , 2001 .
[3] Massimo Manghisoni,et al. Submicron CMOS technologies for low-noise analog front-end circuits , 2002 .
[4] Francesco Corsi,et al. Ultra Low Noise CMOS preamplifier-shaper for X-ray spectroscopy , 1998 .
[5] R. Castello,et al. Experimental study and modeling of the white noise sources in submicron Pand N-MOSFETs , 2001 .
[6] S. Tedja,et al. Noise spectral density measurements of a radiation hardened CMOS process in the weak and moderate inversion , 1991, Conference Record of the 1991 IEEE Nuclear Science Symposium and Medical Imaging Conference.
[7] Federico Faccio,et al. Noise characterization of a CMOS technology for the LHC experiments , 2001 .
[8] W. Dabrowski,et al. Development of a fully integrated readout system for high counting rate position sensitive measurements of X-rays using silicon strip detectors , 2000 .