The challenges of device scaling and short channel effects have necessitated the close examination of 3 dimensional processing. While this certainly comes with challenges in processing and metrology, it also comes with opportunities for new device paradigms and analysis methods. We will look at an historical perspective of 3D processing and further examine how to accurately ldquothinkrdquo 3D to achieve some of these goals and the ramifications of a few interesting device tricks that 3D processing provides.