论文信息 - Investigation of interfacial roughness of InxGa1−xAs epitaxial layers on GaAs and InP substrates by soft x‐ray reflectivity - 字舞流文

Investigation of interfacial roughness of InxGa1−xAs epitaxial layers on GaAs and InP substrates by soft x‐ray reflectivity

V. Rehn | H. Resat | T. Nee | T. Cole | A. Król | Y. Kao | S. Woronick | W. Ng | A. Green | C. Lowe-Ma | C. Sher