论文信息 - High Temperature Annealing of ZnO:Al on Passivating POLO Junctions: Impact on Transparency, Conductivity, Junction Passivation, and Interface Stability - 字舞流文

High Temperature Annealing of ZnO:Al on Passivating POLO Junctions: Impact on Transparency, Conductivity, Junction Passivation, and Interface Stability

A. Feldhoff | R. Brendel | B. Min | Y. Larionova | R. Peibst | F. Heinemeyer | J. Krügener | Sina Reiter | D. Tetzlaff | T. Wietler | R. Reineke-Koch