Non-Monte-Carlo methodology for high-sigma simulations of circuits under workload-dependent BTI degradation—Application to 6T SRAM
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G. Groeseneken | B. Kaczer | P. Weckx | H. Kukner | J. Roussel | P. Raghavan | F. Catthoor | B. Kaczer | F. Catthoor | G. Groeseneken | J. Roussel | P. Weckx | H. Kukner | P. Raghavan
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