Principles and Applications of the qPlus Sensor
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[1] Jochen Mannhart,et al. Friction traced to the single atom , 2002, Proceedings of the National Academy of Sciences of the United States of America.
[2] O. Wolter,et al. Micromachined silicon sensors for scanning force microscopy , 1991 .
[3] J. Rychen. Combined low-temperature scanning probe microscopy and magneto-transport experiments for the local investigation of mesoscopic systems , 2001 .
[4] Hiroshi Itoh,et al. Analog frequency modulation detector for dynamic force microscopy , 2001 .
[5] Hemantha K. Wickramasinghe,et al. Atomic force microscope–force mapping and profiling on a sub 100‐Å scale , 1987 .
[6] F. Giessibl,et al. Atomic Resolution of the Silicon (111)-(7x7) Surface by Atomic Force Microscopy , 1995, Science.
[7] Calvin F. Quate,et al. Improved atomic force microscope images using microcantilevers with sharp tips , 1990 .
[8] Franz J. Giessibl,et al. The Force Needed to Move an Atom on a Surface , 2008, Science.
[9] J. Mannhart,et al. Evaluation of a force sensor based on a quartz tuning fork for operation at low temperatures and ultrahigh vacuum , 2002 .
[10] Jochen Mannhart,et al. Stability considerations and implementation of cantilevers allowing dynamic force microscopy with optimal resolution: the qPlus sensor , 2004 .
[11] J. Mannhart,et al. Imaging of atomic orbitals with the Atomic Force Microscope - experiments and simulations , 2001 .
[12] Bielefeldt,et al. Subatomic Features on the Silicon (111)-(7x7) Surface Observed by Atomic Force Microscopy. , 2000, Science.
[13] J. M. Drake,et al. Special Issue: Dynamics of Molecular Systems , 1990 .
[14] K. Dransfeld,et al. Scanning near-field acoustic microscopy , 1989 .
[15] Franz J. Giessibl,et al. HIGH-SPEED FORCE SENSOR FOR FORCE MICROSCOPY AND PROFILOMETRY UTILIZING A QUARTZ TUNING FORK , 1998 .
[16] M. Tomitori,et al. Bias dependence of Si(111)7×7 images observed by noncontact atomic force microscopy , 2000 .
[17] M. Reichling,et al. Imaging the atomic arrangements on the high-temperature reconstructed α-Al2O3(0001) surface , 2001, Nature.
[18] P. Schendel,et al. Operation characteristics of piezoelectric quartz tuning forks in high magnetic fields at liquid helium temperatures , 1999, cond-mat/9907079.
[19] D. Rugar,et al. Frequency modulation detection using high‐Q cantilevers for enhanced force microscope sensitivity , 1991 .
[20] H. J. Hug,et al. Force-distance studies with piezoelectric tuning forks below 4.2 K , 2000, cond-mat/0005513.
[21] Weber,et al. Computer simulation of local order in condensed phases of silicon. , 1985, Physical review. B, Condensed matter.
[22] K. Karrai,et al. Piezoelectric tip‐sample distance control for near field optical microscopes , 1995 .
[23] H. Freund,et al. Double quartz tuning fork sensor for low temperature atomic force and scanning tunneling microscopy , 2004 .
[24] Franz J. Giessibl,et al. Atomic resolution on Si(111)-(7×7) by noncontact atomic force microscopy with a force sensor based on a quartz tuning fork , 2000 .
[25] Leslie Berlin,et al. The Man Behind the Microchip: Robert Noyce and the Invention of Silicon Valley , 2005 .
[26] G. Nunes,et al. Attractive-mode force microscope for investigations of biomolecules under ambient conditions , 2001 .
[27] Kiyoyuki Terakura,et al. Surface-tip interactions in noncontact atomic-force microscopy on reactive surfaces: Si(111) , 1998 .
[28] M. Lagally,et al. Imaging of all dangling bonds and their potential on the Ge/Si105 surface by noncontact atomic force microscopy. , 2004, Physical review letters.
[29] C. J. Chen,et al. Introduction to Scanning Tunneling Microscopy , 1993 .
[30] Urs Dürig,et al. DYNAMIC FORCE MICROSCOPY BY MEANS OF THE PHASE-CONTROLLED OSCILLATOR METHOD , 1997 .
[31] Heinrich Rohrer,et al. 7 × 7 Reconstruction on Si(111) Resolved in Real Space , 1983 .
[32] Franz J. Giessibl,et al. Advances in atomic force microscopy , 2003, cond-mat/0305119.
[33] Calvin F. Quate,et al. Microfabrication of cantilever styli for the atomic force microscope , 1990 .
[34] Quartz tuning forks as sensors for attractive-mode force microscopy under ambient conditions , 2001 .
[35] T. Ihn,et al. A low-temperature dynamic mode scanning force microscope operating in high magnetic fields , 1999, cond-mat/9901023.
[36] Franz J. Giessibl,et al. Principle of NC-AFM , 2002 .
[37] A. Rohl,et al. Contrast mechanism in non-contact SFM imaging of ionic surfaces , 1999 .
[38] Paul Horowitz,et al. The Art of Electronics , 1980 .
[39] H. Güntherodt,et al. Quantitative Measurement of Short-Range Chemical Bonding Forces , 2001, Science.
[40] Jochen Mannhart,et al. Revealing the hidden atom in graphite by low-temperature atomic force microscopy , 2003, Proceedings of the National Academy of Sciences of the United States of America.
[41] J. Mannhart,et al. Force Microscopy with Light-Atom Probes , 2004, Science.
[42] Franz J. Giessibl,et al. Forces and frequency shifts in atomic-resolution dynamic-force microscopy , 1997 .