论文信息 - A new optical configuration in speckle interferometry for contouring of three-dimensional objects

A new optical configuration in speckle interferometry for contouring of three-dimensional objects

A novel optical configuration for contouring of three-dimensional objects is presented. In this configuration (referred to as image plane speckle interferometry) an object point is viewed symmetrically with respect to the surface normal and combined coherently at the image plane of the imaging system. This configuration is simple to implement and provides the possibility to vary the sensitivity over a wide range. Detailed theory and experimental results are presented.

[1] H J Tiziani,et al. Contouring by electronic speckle pattern interferometry employing dual beam illumination. , 1990, Applied optics.

[2] V. Fossati-Bellani,et al. Holographic contouring by displacing the object and the illumination beam , 1978 .

[3] Charles Joenathan,et al. Twofold increase in sensitivity with a dual‐beam illumination arrangement for electronic speckle pattern interferometry , 1996 .

[4] Jerry S. Zelenka,et al. A new method for generating depth contours holographically. , 1968, Applied optics.

[5] R. Sirohi. Speckle Metrology , 1993, Optical Methods of Measurement.