Voltage-comparator-based measurement of equivalently sampled substrate noise waveform in mixed-signal integrated circuits
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M. Hotta | K. Makie-Fukuda | T. Anbo | T. Matsuura | T. Tsukada | T. Matsuura | T. Tsukada | K. Makie-Fukuda | M. Hotta | T. Anbo
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