Estimation of Archival Lifetime Distribution for Writable Optical Disks from Accelerated Testings

ISO/IEC 10995:2008 specifies a procedure for estimating the distribution of archival lifetimes of optical disks from accelerated lifetime test results. In this article we derive the maximum likelihood estimator of the lifetime distributions based on an accelerated lifetime model, an Eyring model, and lognormal distribution, from a reliability engineering perspective. We also propose a procedure to analyze a data set from an accelerated lifetime test.