A Supply Current Test Method for Bridging Faults in CMOS Microprocessor Based Circuits
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Masaki Hashizume | Hiroyuki Yotsuyanagi | Takeomi Tamesada | Ikuro Morita | Takahiro Oie | Eiji Tasaka | Toshihiro Kayahara
[1] Najmi T. Jarwala,et al. A Framework for Boundary-Scan Based System Test and Diagnosis , 1992, Proceedings International Test Conference 1992.
[2] Edward J. McCluskey,et al. Detecting bridging faults with stuck-at test sets , 1988, International Test Conference 1988 Proceeding@m_New Frontiers in Testing.
[3] W. R. Moore,et al. Testing interconnects: a pin adjacency approach , 1993, Proceedings ETC 93 Third European Test Conference.
[4] Masaki Hashizume,et al. Supply Current Measurement Circuit for Bridging Fault Detection in Microprocessor Based Circuit , 1997 .
[5] Thomas W. Williams,et al. ENHANCING BOARD FUNCTIONAL SELF-TEST BY CONCURRENT SAMPLING , 1991, 1991, Proceedings. International Test Conference.
[6] Wu-Tung Cheng,et al. Diagnosis for wiring interconnects , 1990, Proceedings. International Test Conference 1990.
[7] Masaki Hashizume,et al. A Practical Functional Test Using Flowchart for Production Testing of Microprocessor Based Sequence Controllers (Special Issue on VLSI Testing and Testable Design) , 1993 .
[8] William H. Kautz,et al. Testing for Faults in Wiring Networks , 1974, IEEE Transactions on Computers.