SPRT for Weibull distributed integrated circuit failures
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[1] K. K. Sharma,et al. Robustness of sequential Weibull life-test plans , 1993 .
[2] M.H. Woods,et al. MOS VLSI reliability and yield trends , 1986, Proceedings of the IEEE.
[3] S. Wolf,et al. Silicon Processing for the VLSI Era , 1986 .
[4] Albert H. Moore,et al. An Evaluation of Exponential and Weibull Test Plans , 1976, IEEE Transactions on Reliability.
[5] K. K. Sharma,et al. Robustness of sequential gamma life testing procedures , 1990 .
[6] G. S. Mudholkar,et al. Exponentiated Weibull family for analyzing bathtub failure-rate data , 1993 .
[7] W. Kuo. Reliability Enhancement Through Optimal Burn-In , 1984, IEEE Transactions on Reliability.
[8] R. Phatarfod,et al. A Sequential Test for Gamma Distributions , 1971 .
[9] D. J. Bartholomew,et al. A Sequential Test for Randomness of Intervals , 1956 .
[10] Nozer D. Singpurwalla,et al. Robustness of sequential exponential life-testing procedures , 1985 .
[11] Stuart K. Tewksbury,et al. Wafer-level integrated systems : implementation issues , 1989 .
[12] Magne Vollan Aarset,et al. How to Identify a Bathtub Hazard Rate , 1987, IEEE Transactions on Reliability.