Modeling and analysis of single-event transients in charge pumps
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[1] T. D. Loveless,et al. A Single-Event-Hardened Phase-Locked Loop Fabricated in 130 nm CMOS , 2007, IEEE Transactions on Nuclear Science.
[2] P.H. Eaton,et al. SEU and SET Modeling and Mitigation in Deep Submicron Technologies , 2007, 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual.
[3] T. D. Loveless,et al. A Hardened-by-Design Technique for RF Digital Phase-Locked Loops , 2006, IEEE Transactions on Nuclear Science.
[4] L. Massengill,et al. Towards SET Mitigation in RF Digital PLLs: From Error Characterization to Radiation Hardening Considerations , 2005, IEEE Transactions on Nuclear Science.
[5] H.J. Barnaby,et al. Analysis of Single Events Effects on Monolithic PLL Frequency Synthesizers , 2006, IEEE Transactions on Nuclear Science.
[6] Yann Deval,et al. Investigation of single-event transients in voltage-controlled oscillators , 2003 .
[7] T. D. Loveless,et al. Modeling and Mitigating Single-Event Transients in Voltage-Controlled Oscillators , 2007, IEEE Transactions on Nuclear Science.
[8] T. L. Turflinger,et al. Single-event effects in analog and mixed-signal integrated circuits , 1996 .
[9] V. Pouget,et al. Impact of VCO Topology on SET Induced Frequency Response , 2007, IEEE Transactions on Nuclear Science.