论文信息 - Total dose and single event effects testing of the Intel pentium III (P3) and AMD K7 microprocessors

Total dose and single event effects testing of the Intel pentium III (P3) and AMD K7 microprocessors

To understand the radiation sensitivity and radiation response, Intel Pentium III and AMD K7 microprocessors were tested for total ionizing dose and single event effects. The processors have been found to be extremely tolerant to total ionizing dose and no radiation-induced latchups have been observed with protons or heavy ions to an LET of approximately 15 MeV-cm/sup 2//mg. Single event upset and functional interrupts have been observed for both protons and heavy ions.

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