Design and Realization of General Tester Based on IEEE1149.1 Standard

For solving the test problems of circuits on board-stage or system-stage, the design scheme of general tester based on IEEE 1149.1 standard is presented in this paper. The tester can realize circuits' on-line and off-line tests. In addition, by using an embedded technology, such as DSP, FPGA etc, the tester will have the features of small-size, low-cost, general-purpose and easy-embedment.