Bayesian Analysis of Step-Stress Accelerated Life Tests and Its Use in Planning

ABSTRACT A Bayesian analysis of step-stress accelerated life test data is introduced and illustrated by an experiment on cryogenic cables. A cumulative damage model is used to describe the cumulative distribution function of Weibull lifetimes. The analysis methodology can then be used to evaluate a step-stress accelerated life test plan through simulation and calculation of appropriate criteria. Such planning is illustrated with the cryogenic cable example.

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