论文信息 - Electro‐thermal stress and high electric field effects in CVD‐Grown 4H‐SiC P‐N junction diodes - 字舞流文

Electro‐thermal stress and high electric field effects in CVD‐Grown 4H‐SiC P‐N junction diodes

D. Sheridan | J. Casady | C. Tin | T. Sudarshan | M. Lang | R. Hu | V. Madangarli | G. Gradinaru | T. Isaacs-smith