论文信息 - Microscopic Analysis of High Quality Thick ZnO CVD Layers: Imaging of Growth Domains, Strain Relaxation, and Impurity Incorporation - 字舞流文

Microscopic Analysis of High Quality Thick ZnO CVD Layers: Imaging of Growth Domains, Strain Relaxation, and Impurity Incorporation

B. Meyer | A. Hoffmann | J. Christen | T. Riemann | A. Kaschner | D. M. Hofmann | A. Zeuner | G. Kaczmarczyk