A reconfigurable design-for-debug infrastructure for SoCs

In this paper we present a design-for-debug (DFD) reconfigurable infrastructure for SoCs to support at-speed in-system functional debug. A distributed reconfigurable fabric inserted at RTL provides a debug platform that can be configured and operated post-silicon via the JTAG port. The platform can be repeatedly reused to configure many debug structures such as assertions checkers, transaction identifiers, triggers, and event counters

[1]  Robert K. Brayton,et al.  Whirlpool PLAs: a regular logic structure and their synthesis , 2002, ICCAD 2002.

[2]  Costas J. Spanos,et al.  Modeling within-die spatial correlation effects for process-design co-optimization , 2005, Sixth international symposium on quality electronic design (isqed'05).

[3]  Yu Hen Hu,et al.  Correlation-preserved non-Gaussian statistical timing analysis with quadratic timing model , 2005, Proceedings. 42nd Design Automation Conference, 2005..

[4]  Rolf Drechsler,et al.  BDD minimization using symmetries , 1999, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

[5]  Randal E. Bryant,et al.  Exploiting symmetry when verifying transistor-level circuits by symbolic trajectory evaluation , 1999, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

[6]  Paulo F. Flores,et al.  Assignment and reordering of incompletely specified pattern sequences targetting minimum power dissipation , 1999, Proceedings Twelfth International Conference on VLSI Design. (Cat. No.PR00013).

[7]  Jih-Sheng Shen,et al.  A low-power crossroad switch architecture and its core placement for network-on-chip , 2005, ISLPED '05. Proceedings of the 2005 International Symposium on Low Power Electronics and Design, 2005..

[8]  Krishnendu Chakrabarty,et al.  Test resource optimization for multi-site testing of SOCs under ATE memory depth constraints , 2002, Proceedings. International Test Conference.

[9]  Bogdan J. Falkowski,et al.  Symmetry conditions of Boolean functions in complex Hadamard transform , 1998 .

[10]  Pasi Liljeberg,et al.  Implementation of a self-timed segmented bus , 2003, IEEE Design & Test of Computers.

[11]  Yu-Chin Hsu,et al.  Visibility enhancement for silicon debug , 2006, 2006 43rd ACM/IEEE Design Automation Conference.

[12]  Shuvra S. Bhattacharyya,et al.  Joint application mapping/interconnect synthesis techniques for embedded chip-scale multiprocessors , 2005, IEEE Transactions on Parallel and Distributed Systems.

[13]  H. Wong,et al.  Electrostatic analysis of carbon nanotube arrays , 2003, International Conference on Simulation of Semiconductor Processes and Devices, 2003. SISPAD 2003..

[14]  Giovanni De Micheli,et al.  Design, synthesis, and test of networks on chips , 2005, IEEE Design & Test of Computers.

[15]  Yehea I. Ismail,et al.  Statistical static timing analysis: how simple can we get? , 2005, Proceedings. 42nd Design Automation Conference, 2005..

[16]  Bapiraju Vinnakota,et al.  Defect-oriented test scheduling , 1999, Proceedings 17th IEEE VLSI Test Symposium (Cat. No.PR00146).

[17]  Elizabeth M. Rudnick,et al.  Diagnostic Fault Simulation of Sequential Circuits , 1992, Proceedings International Test Conference 1992.

[18]  Irith Pomeranz,et al.  Fault dictionary compression and equivalence class computation for sequential circuits , 1993, ICCAD.

[19]  Magdy S. Abadir,et al.  Reducing pattern delay variations for screening frequency dependent defects , 2005, 23rd IEEE VLSI Test Symposium (VTS'05).

[20]  Luca Benini,et al.  Networks on Chips : A New SoC Paradigm , 2022 .

[21]  Kaustav Banerjee,et al.  A power-optimal repeater insertion methodology for global interconnects in nanometer designs , 2002 .

[22]  Ankur Srivastava,et al.  A general framework for accurate statistical timing analysis considering correlations , 2005, Proceedings. 42nd Design Automation Conference, 2005..

[23]  Hoi-Jun Yoo,et al.  Analysis and implementation of practical, cost-effective networks on chips , 2005, IEEE Design & Test of Computers.

[24]  Amarendra Mukhopadhyay,et al.  Detection of Total or Partial Symmetry of a Switching Function with the Use of Decomposition Charts , 1963, IEEE Trans. Electron. Comput..

[25]  Irith Pomeranz,et al.  On determining symmetries in inputs of logic circuits , 1994, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

[26]  Resve A. Saleh,et al.  Exact evaluation of diagnostic test resolution , 1992, [1992] Proceedings 29th ACM/IEEE Design Automation Conference.

[27]  Martel,et al.  Intertube coupling in ropes of single-wall carbon nanotubes , 2000, Physical review letters.

[28]  F. Léonard Crosstalk between nanotube devices: contact and channel effects , 2006, cond-mat/0602006.

[29]  W. Dally,et al.  Route packets, not wires: on-chip interconnection networks , 2001, Proceedings of the 38th Design Automation Conference (IEEE Cat. No.01CH37232).

[30]  Robert K. Brayton,et al.  PLA-based regular structures and their synthesis , 2003, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

[31]  Anantha Chandrakasan,et al.  Optimal supply and threshold scaling for subthreshold CMOS circuits , 2002, Proceedings IEEE Computer Society Annual Symposium on VLSI. New Paradigms for VLSI Systems Design. ISVLSI 2002.

[32]  Wei Jiang,et al.  Enhancing reliability and flexibility of a system-on-chip using reconfigurable logic , 2005, 48th Midwest Symposium on Circuits and Systems, 2005..

[33]  Miroslav N. Velev,et al.  Efficient translation of Boolean formulas to CNF in formal verification of microprocessors , 2004, ASP-DAC 2004: Asia and South Pacific Design Automation Conference 2004 (IEEE Cat. No.04EX753).

[34]  M. Radosavljevic,et al.  High-field electrical transport and breakdown in bundles of single-wall carbon nanotubes , 2001 .

[35]  Yu-Chin Hsu,et al.  Advanced techniques for RTL debugging , 2003, Proceedings 2003. Design Automation Conference (IEEE Cat. No.03CH37451).

[36]  Luca Benini,et al.  NoC synthesis flow for customized domain specific multiprocessor systems-on-chip , 2005, IEEE Transactions on Parallel and Distributed Systems.

[37]  Sani R. Nassif,et al.  Models of process variations in device and interconnect , 2000 .

[38]  Rohit Kapur,et al.  A new methodology for improved tester utilization , 2001, Proceedings International Test Conference 2001 (Cat. No.01CH37260).

[39]  K. Ravindran,et al.  First-Order Incremental Block-Based Statistical Timing Analysis , 2004, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.

[40]  S. Pravossoudovitch,et al.  Reduction of power consumption during test application by test vector ordering , 1997 .

[41]  Sachin S. Sapatnekar,et al.  Statistical Timing Analysis Considering Spatial Correlations using a Single Pert-Like Traversal , 2003, ICCAD 2003.

[42]  Irith Pomeranz,et al.  Techniques for minimizing power dissipation in scan and combinational circuits during test application , 1998, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

[43]  T. Larrabee Creating Small Fault Dictionaries , 1998 .

[44]  Erik Jan Marinissen,et al.  Optimisation of on-chip design-for-test infrastructure for maximal multi-site test throughput , 2005 .

[45]  Massoud Pedram,et al.  Architectural energy optimization by bus splitting , 2002, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

[46]  Michael J. Flynn Area - Time - Power and Design effort: the basic tradeoffs in Application Specific Systems , 2005, ASAP.

[47]  Robert K. Brayton,et al.  River PLAs: a regular circuit structure , 2002, DAC '02.

[48]  Richard H. Livengood,et al.  Design for (physical) debug for silicon microsurgery and probing of flip-chip packaged integrated circuits , 1999, International Test Conference 1999. Proceedings (IEEE Cat. No.99CH37034).

[49]  David P. Vallett,et al.  Picosecond imaging circuit analysis , 1998, IBM J. Res. Dev..

[50]  Steven J. E. Wilton,et al.  Architectures and algorithms for synthesizable embedded programmable logic cores , 2003, FPGA '03.

[51]  Ajay Khoche,et al.  Test economics for multi-site test with modern cost reduction techniques , 2002, Proceedings 20th IEEE VLSI Test Symposium (VTS 2002).

[52]  M. Horowitz,et al.  How scaling will change processor architecture , 2004, 2004 IEEE International Solid-State Circuits Conference (IEEE Cat. No.04CH37519).

[53]  Sani R. Nassif,et al.  The care and feeding of your statistical static timer , 2004, IEEE/ACM International Conference on Computer Aided Design, 2004. ICCAD-2004..

[54]  Sandeep Kumar Goel,et al.  Design for debug: catching design errors in digital chips , 2002, IEEE Design & Test of Computers.

[55]  K. Banerjee,et al.  Global (interconnect) warming , 2001 .

[56]  Li-Shiuan Peh,et al.  Leakage power modeling and optimization in interconnection networks , 2003, ISLPED '03.

[57]  E. Alon,et al.  The implementation of a 2-core, multi-threaded itanium family processor , 2006, IEEE Journal of Solid-State Circuits.

[58]  David Blaauw,et al.  Statistical Timing Analysis for Intra-Die Process Variations with Spatial Correlations , 2003, ICCAD 2003.

[59]  Vamsi Boppana,et al.  Full fault dictionary storage based on labeled tree encoding , 1996, Proceedings of 14th VLSI Test Symposium.

[60]  Malgorzata Marek-Sadowska,et al.  Generalized Reed-Muller Forms as a Tool to Detect Symmetries , 1996, IEEE Trans. Computers.

[61]  Irith Pomeranz,et al.  On Dictionary-Based Fault Location in Digital Logic Circuits , 1997, IEEE Trans. Computers.