Automatic calibration of a projector-camera system with a see-through screen

This paper proposes a method for automatic calibration of a projector-camera system with a see-through screen. Conventional projector-camera systems usually project a calibration pattern on an opaque screen for calibrating the system. Images captured by the camera contain only the calibration pattern. Recently, projector-camera systems with see-through screen have been developed for visual collaboration. Due to the semi-transparent property of the see-through screen, not only the calibration pattern, but also the background on the opposite side of the screen is captured by the camera. Since the calibration pattern is contaminated by the image of the background, conventional feature detection methods have difficulty in detecting the features of the calibration pattern and thus often fail to calibrate the system. In the proposed methods, the calibration pattern is temporally varied so that temporal correlation can be applied on a sequence of captured images to separate the calibration pattern from the background. This method works robustly and accurately even for backgrounds with high dynamic range and large motion. The entire calibration process is fully automatic and does not require any parameter tuning.

[1]  Rahul Sukthankar,et al.  Smarter Presentations: Exploiting Homography in Camera-Projector Systems , 2001, ICCV.

[2]  Masatoshi Okutomi,et al.  A user-friendly method to geometrically calibrate projector-camera systems , 2009, 2009 IEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops.

[3]  Ramin Samadani,et al.  Gaze awareness and interaction support in presentations , 2010, ACM Multimedia.

[4]  Masatoshi Okutomi,et al.  Direct image alignment of projector-camera systems with planar surfaces , 2010, 2010 IEEE Computer Society Conference on Computer Vision and Pattern Recognition.

[5]  Soon-Yong Park,et al.  Active Calibration of Camera-Projector Systems Based on Planar Homography , 2010, 2010 20th International Conference on Pattern Recognition.