A novel test generation approach for parametric faults in linear analog circuits

While analog test generation tools are still in their infancy, the corresponding tools in the digital domain have reached a fair degree of maturity and acceptance. Recognizing this fact, we propose a novel test generation method for linear analog circuits that employs well established digital test software to generate time-domain tests for analog parametric faults. We transform the analog circuit to an equivalent digital circuit, and target only those stuck-at faults in the digital circuit that could possibly capture parametric failures in the original analog circuit. Hence, the sequence of digital test vectors obtained from any test generator represents a test waveform for the analog parametric faults. The technique is illustrated using examples that show this to be a simple, yet attractive alternative to costlier simulation-based analog test generation approaches.