Evaluation of pure tin plated copper alloy substrates for tin whiskers

Purpose – The purpose of this paper is to present the results from work on a project aimed at evaluating six different copper alloy substrates coated with pure tin for tin whisker growth. The influence of intermetallic growth between the copper alloy substrate and the tin‐plating on the growth of tin whiskers has been investigated.Design/methodology/approach – The experiment consisted of six substrates of different alloys of copper, plated with bright tin including copper beryllium, cartridge brass, phosphor bronze, Cu‐Ni‐Si “7025” and Cu‐Ni‐Sn “spinodal”. The samples were mechanically stressed and then subjected to temperature humidity storage conditions for 1,000 h. These samples were then evaluated for tin whisker growth and intermetallic layer thickness.Findings – Of the six samples five showed tin whisker growth. For these samples the intermetallic layer thickness has little effect on tin whisker growth. Sample with Cu‐Ni‐Sn “spinodal” alloy substrate showed very low whisker density and comparatively...