High resolution particle tracking method by suppressing the wavefront aberrations

Digital in-line holographic microscopy is one of the most efficient methods for particle tracking as it can precisely measure the axial position of particles. However, imaging systems are often limited by detector noise, image distortions and human operator misjudgment making the particles hard to locate. A general method is used to solve this problem. The normalized holograms of particles were reconstructed to the pupil plane and then fit to a linear superposition of the Zernike polynomial functions to suppress the aberrations. Relative experiments were implemented to validate the method and the results show that nanometer scale resolution was achieved even when the holograms were poorly recorded.