The photoelastic constant and internal stress around micropipe defects of 6H-SiC single crystal
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Takashi Okuda | Tomohisa Kato | T. Okuda | Tomohisa Kato | H. Ohsato | A. Okamoto | Hitoshi Ohsato | Naohiro Sugiyama | Atsuto Okamoto | Naohiro Sugiyama
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