A fast simulation approach for inductive effects of VLSI interconnects

Modeling on-chip inductive effects for interconnects of multi-gigahertz microprocessors remains challenging. SPICE simulation of these effects is very slow because of the large number of mutual inductances. Meanwhile, ignoring the non-linear behavior of drivers in a fast linear circuit simulator results in large errors for the inductive effect. In this paper, a fast and accurate time-domain transient analysis approach is presented, which captures the non-linearity of circuit drivers, the effect of non-ideal ground and de-coupling capacitors in a bus structure. The proposed method models the non-linearity of drivers in conjunction with specific bus geometries. Linearized waveforms at each driver output are incorporated into an interconnect reduced-order simulator for fast transient simulation. In addition, non-ideal ground and de-coupling capacitor models enable accurate signal and ground bounce simulations. Results show that this simulation approach is up-to 68x faster than SPICE while maintaining 95% accuracy.

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