论文信息 - Microstructure Characterization of Si/Ni Contact Layers on n-Type 4H-SiC by TEM and XEDS - 字舞流文

Microstructure Characterization of Si/Ni Contact Layers on n-Type 4H-SiC by TEM and XEDS

A. Piotrowska | A. Kuchuk | M. Wzorek | J. Ratajczak | M. Borysiewicz | J. Kątcki | A. Czerwiński