Infrared Ship Classification Using A New Moment Pattern Recognition Concept

An analysis of the statistics of the moments and the conventional invariant moments shows that the variance of the latter become quite large as the order of the moments and the degree of invariance increases. Moreso, the need to whiten the error volume increases with the order and degree, but so does the computational load associated with computing the whitening operator. We thus advance a new estimation approach to the use of moments in pattern recog-nition that overcomes these problems. This work is supported by experimental verification and demonstration on an infrared ship pattern recognition problem. The computational load associated with our new algorithm is also shown to be very low.