Integration Process and Reliability for SrBi₂ Ta₂O 9 -based Ferroelectric Memories
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Young-Jin Park | Seaung-Suk Lee | Sang-Won Lee | B. Yang | Y. M. Kang | K. H. Noh | Sungpack Hong | Sang Hyun Oh | E. Y. Kang | J. G. Kim | C. W. Shu | J. W. Seong | C. G. Lee | N. S. Kang | Sang‐Hyun Oh | N. Kang | Young-Jin Park | Seaung-Suk Lee | Y. M. Kang | J. Kim | S. K. Hong | B. Yang | K. Noh | C. Shu | Sang-Won Lee | J. Seong
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