Discriminative illumination: Per-pixel classification of raw materials based on optimal projections of spectral BRDF
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[1] David G. Stork,et al. Pattern classification, 2nd Edition , 2000 .
[2] R. Fisher. THE USE OF MULTIPLE MEASUREMENTS IN TAXONOMIC PROBLEMS , 1936 .
[3] Andrew Zisserman,et al. A Statistical Approach to Texture Classification from Single Images , 2004, International Journal of Computer Vision.
[4] F. E. Nicodemus,et al. Geometrical considerations and nomenclature for reflectance , 1977 .
[5] Amit Ashok,et al. Task-specific information for imaging system analysis. , 2007, Journal of the Optical Society of America. A, Optics, image science, and vision.
[6] João Gama,et al. Cascade Generalization , 2000, Machine Learning.
[7] Frédo Durand,et al. Experimental analysis of BRDF models , 2005, EGSR '05.
[8] Wang Yingkuan. Computer Vision Technology for Food Quality Evaluation , 2009 .
[9] Xiaodi Huang,et al. Recovery of Metals from Aluminum Dross and Saltcake , 2006 .
[10] T. Treibitz,et al. Recovery limits in pointwise degradation , 2009, 2009 IEEE International Conference on Computational Photography (ICCP).
[11] Milo W Hyde,et al. Enhanced material classification using turbulence-degraded polarimetric imagery. , 2010, Optics letters.
[12] Yoav Freund,et al. A decision-theoretic generalization of on-line learning and an application to boosting , 1995, EuroCOLT.
[13] Bernd Jähne,et al. Learning of Optimal Illumination for Material Classification , 2010, DAGM-Symposium.
[14] Stephen C. Cain,et al. Material Classification of an Unknown Object Using Turbulence-Degraded Polarimetric Imagery , 2011, IEEE Transactions on Geoscience and Remote Sensing.
[15] John Bares,et al. Material Classification By Drilling , 2000 .
[16] M. Landy,et al. The Plenoptic Function and the Elements of Early Vision , 1991 .
[17] Sabine Süsstrunk,et al. Material Classification Using Color and NIR Images , 2009, CIC.
[18] Takahiko Horiuchi,et al. Spectral imaging method for material classification and inspection of printed circuit boards , 2010 .
[19] Shree K. Nayar,et al. Multiplexing for Optimal Lighting , 2007, IEEE Transactions on Pattern Analysis and Machine Intelligence.
[20] R. Polikar,et al. Ensemble based systems in decision making , 2006, IEEE Circuits and Systems Magazine.
[21] Mark A Neifeld,et al. Feature-specific imaging. , 2003, Applied optics.
[22] Bert Bras,et al. Technologies for the Identification, Separation and Recycling of Automotive Plastics , 1996 .
[23] Duke Gledhill,et al. Surface measurement using active vision and light scattering , 2007 .
[24] Jitendra Malik,et al. Representing and Recognizing the Visual Appearance of Materials using Three-dimensional Textons , 2001, International Journal of Computer Vision.
[25] Ramesh Raskar,et al. Fast separation of direct and global components of a scene using high frequency illumination , 2006, SIGGRAPH 2006.
[26] Paul A. Viola,et al. Rapid object detection using a boosted cascade of simple features , 2001, Proceedings of the 2001 IEEE Computer Society Conference on Computer Vision and Pattern Recognition. CVPR 2001.
[27] Wojciech Matusik,et al. A data-driven reflectance model , 2003, ACM Trans. Graph..
[28] Ko Nishino. Directional statistics BRDF model , 2009, 2009 IEEE 12th International Conference on Computer Vision.
[29] Andrew Zisserman,et al. A Statistical Approach to Material Classification Using Image Patch Exemplars , 2009, IEEE Transactions on Pattern Analysis and Machine Intelligence.
[30] Pieter Peers,et al. Rapid Acquisition of Specular and Diffuse Normal Maps from Polarized Spherical Gradient Illumination , 2007 .
[31] Hua Chen,et al. Polarization Phase-Based Method For Material Classification In Computer Vision , 1998, International Journal of Computer Vision.
[32] Shree K. Nayar,et al. A theory of multiplexed illumination , 2003, Proceedings Ninth IEEE International Conference on Computer Vision.
[33] Oliver Wang,et al. Material classification using BRDF slices , 2009, CVPR.
[34] David J. Kriegman,et al. Eigenfaces vs. Fisherfaces: Recognition Using Class Specific Linear Projection , 1996, ECCV.
[35] Lorenzo Bruzzone,et al. Classification of hyperspectral remote sensing images with support vector machines , 2004, IEEE Transactions on Geoscience and Remote Sensing.
[36] Yoshinori Kobayashi,et al. Object Material Classification by Surface Reflection Analysis with a Time-of-Flight Range Sensor , 2010, ISVC.
[37] Kristin J. Dana,et al. 3D Texture Recognition Using Bidirectional Feature Histograms , 2004, International Journal of Computer Vision.
[38] A. B. Orun,et al. Material identification by surface reflection analysis in combination with bundle adjustment technique , 2003, Pattern Recognit. Lett..
[39] Matthew O'Toole,et al. BRDF Acquisition with Basis Illumination , 2007, 2007 IEEE 11th International Conference on Computer Vision.
[40] Shigeo Abe DrEng. Pattern Classification , 2001, Springer London.
[41] Shehroz S. Khan,et al. A Survey of Recent Trends in One Class Classification , 2009, AICS.
[42] David J. Kriegman,et al. Eigenfaces vs. Fisherfaces: Recognition Using Class Specific Linear Projection , 1996, ECCV.
[43] Lawrence B. Wolff,et al. Polarization-Based Material Classification from Specular Reflection , 1990, IEEE Trans. Pattern Anal. Mach. Intell..