Microstructure and recording properties of bicrystal disks with GaAs substrates
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Bicrystal disks with CoCrTa magnetic layer and Cr underlayer were fabricated on {001} GaAs single crystalline wafers. It is found that the epitaxial orientation relationship of Cr onto GaAs is {001} Cr/spl par/{001} GaAs. Disks with coercivity up to 2600 Oe, accompanied by near unity coercive and remanent squarenesses, were obtained. Measured medium noise power is extremely low and remains unchanged as recording density increases up to 4000 fr/mm. The recording properties of the bicrystal media are compared with those of conventional longitudinal thin film media which have similar coercivities. >
[1] J. Zhu,et al. Effect of in-plane easy axis orientation in narrow track recording , 1993 .
[2] Christopher V. Jahnes,et al. Magnetic properties of CoPtCr thin films with 〈112̄0〉 crystal orientation , 1991 .
[3] D. Laughlin,et al. Investigation of CoNiCr thin films deposited on , 1991 .
[4] Tai Min,et al. Bicrystal advanced thin‐film media for high density recording , 1994 .