Relaxation Times for Magnetization Reversal in a High Coercivity Magnetic Thin Film | NIST

N. D. Rizzo,* T. J. Silva, and A. B. Kos Electromagnetic Technology Division, National Institute of Standards and Technology, Boulder, Colorado 80303 (Received 17 March 1999) We used a magneto-optical Kerr effect microscope to measure 180± magnetization reversal in a high coercivity CoCr10Ta4 thin film subjected to nanosecond field pulses. Exponential magnetization decay occurs for pulse duration tp , 10 ns followed by logarithmic decay for tp . 10 ns, indicating a crossover from nonequilibrium magnetization relaxation at short tp to metastable equilibrium and thermal relaxation for longer tp . We conclude that the nonequilibrium magnetization relaxation time tn and that the average relaxation time of microscopic thermal fluctuations t0 is tn t0 5 ns.

[1]  C. Mccombie,et al.  Solid-State Physics , 1965, Nature.

[2]  E. M. Lifshitz,et al.  Statistical physics. Pt.1, Pt.2 , 1980 .

[3]  C. Mee,et al.  Magnetic Recording Technology , 1996 .