论文信息 - 14C Dating with the Gif-sur-Yvette Tandetron Accelerator: Status Report and Study of Isotopic Fractionation in the Sputter Ion Source

14C Dating with the Gif-sur-Yvette Tandetron Accelerator: Status Report and Study of Isotopic Fractionation in the Sputter Ion Source

The standard procedure for measuring 14C at the Gif-sur-Yvette Tandetron AMS facility is described. A new sample manipulator and automated measurements are being used and have been operational for six months. Evidence of isotopic fractionation in the sputter ion source is provided. We take this into account by measuring the 13C/12C ratio of the sample in the accelerator.

J. Duplessy | E. Bard | H. Valladas | M. Arnold | P. Maurice

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