The utility of resonant soft x-ray scattering and reflectivity for the nanoscale characterization of polymers
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G. Mitchell | C. McNeill | H. Ade | Hongping Yan | S. Swaraj | T. Araki | S. Gaynor | L. Liu | C. Wang | B. Deshmukh | H. Yan | G. Mitchell | T. Araki