DABAM: an open-source database of X-ray mirrors metrology
暂无分享,去创建一个
Frank Siewert | Mourad Idir | Daniele Cocco | Peter Takacs | Lorenzo Raimondi | Luca Rebuffi | Xianbo Shi | Manuel Sanchez del Rio | Jim Metz | Ruben Reininger | Davide Bianchi | Mark Glass | Sibylle Spielmann-Jaeggi | Muriel Tomasset | Tom Tonnessen | Amparo Vivo | Valeriy Yashchuk
[1] J. Zavada,et al. Relationship between surface scattering and microtopographic features (A) , 1979 .
[2] Heinz-Otto Peitgen,et al. The science of fractal images , 2011 .
[3] F. Siewert,et al. Propagation of coherent light pulses with PHASE , 2014, Optics & Photonics - Optical Engineering + Applications.
[4] Hidekazu Mimura,et al. Requirements on hard x-ray grazing incidence optics for European XFEL: analysis and simulation of wavefront transformations , 2009, Optics + Optoelectronics.
[5] Peter Z. Takacs,et al. Design Of A Long Trace Surface Profiler , 1987, Photonics West - Lasers and Applications in Science and Engineering.
[6] Xianbo Shi,et al. A new SHADOW update: integrating diffraction effects into ray-tracing , 2014 .
[7] Valeriy V. Yashchuk,et al. Modeling of surface metrology of state-of-the-art x-ray mirrors as a result of stochastic polishing process , 2015, International Conference on Correlation Optics.
[8] B. Krauskopf,et al. Proc of SPIE , 2003 .
[9] Frank Siewert,et al. First report on a European round robin for slope measuring profilers , 2005, SPIE Optics + Photonics.
[10] Hidekazu Mimura,et al. Results of x-ray mirror round-robin metrology measurements at the APS, ESRF, and SPring-8 optical metrology laboratories , 2005, SPIE Optics + Photonics.
[11] J. F. van der Veen,et al. Diffraction-limited storage rings - a window to the science of tomorrow. , 2014, Journal of synchrotron radiation.
[12] Daniele Cocco,et al. Effect of slope errors on the performance of mirrors for x-ray free electron laser applications. , 2015, Optics express.
[13] K. Tiedtke,et al. Sub-nm accuracy metrology for ultra-precise reflective X-ray optics , 2011 .
[14] Riccardo Signorato,et al. Structured slope errors on real x-ray mirrors: ray tracing versus experiment , 1997, Optics & Photonics.
[15] H. Padmore,et al. Theory and practice of elliptically bent x-ray mirrors , 2000 .
[16] Frank Siewert,et al. The Diamond-NOM: A non-contact profiler capable of characterizing optical figure error with sub-nanometre repeatability , 2010 .
[17] J E Harvey,et al. Modeling the image quality of enhanced reflectance x-ray multilayers as a surface power spectral density filter function. , 1995, Applied optics.
[18] E. L. Church,et al. Use of an optical profiling instrument for the measurement of the figure and finish of optical quality surfaces , 1985 .
[19] Gregory Y. Morrison,et al. Performance of the upgraded LTP-II at the ALS Optical Metrology Laboratory , 2008, Optical Engineering + Applications.
[20] F Siewert. Metrology, Mirrors and Gratings – Advances and Challenges in Synchrotron Optics , 2013 .
[21] Lahsen Assoufid,et al. Wave-optical simulation of hard-x-ray nanofocusing by precisely figured elliptical mirrors. , 2007, Applied optics.
[22] Michael Schulz,et al. Scanning deflectometric form measurement avoiding path-dependent angle measurement errors , 2010 .
[23] Richard F. Voss,et al. Fractals in nature: from characterization to simulation , 1988 .
[24] Augusto Marcelli,et al. Waviness effects in ray-tracing of “real” optical surfaces , 1992 .
[25] T. Zeschke,et al. The Nanometer Optical Component Measuring Machine: a new Sub-nm Topography Measuring Device for X-ray Optics at BESSY , 2004 .
[26] Mourad Idir,et al. Modern developments in X-ray and neutron optics , 2008 .
[27] Janez Demšar,et al. A proposal for an open source graphical environment for simulating x-ray optics , 2014 .
[28] L Yaroslavsky,et al. Frequency responses and resolving power of numerical integration of sampled data. , 2005, Optics express.
[29] Frank Siewert,et al. Time-dependent wave front propagation simulation of a hard x-ray split-and-delay unit: Towards a measurement of the temporal coherence properties of x-ray free electron lasers , 2014 .
[30] Valeriy V. Yashchuk,et al. Reliable before-fabrication forecasting of expected surface slope distributions for x-ray optics , 2012 .
[31] Frank Siewert,et al. Upgrade of long trace profiler for characterization of high-precision X-ray mirrors at SPring-8 , 2010 .
[32] C. Kewish,et al. Comparison of two methods for simulation of hard X-ray nanofocusing by elliptical mirrors , 2007 .
[33] E. Church. Fractal surface finish. , 1988, Applied optics.
[34] Valeriy V. Yashchuk,et al. Specification of x-ray mirrors in terms of system performance: new twist to an old plot , 2014 .
[35] Ralf D. Geckeler,et al. Approaching sub-50 nanoradian measurements by reducing the saw-tooth deviation of the autocollimator in the Nano-Optic-Measuring Machine , 2015 .
[36] E. Stoll,et al. Monte Carlo Calculation for Electromagnetic-Wave Scattering from Random Rough Surfaces , 1984 .
[37] S. Lang,et al. An Introduction to Fourier Analysis and Generalised Functions , 1959 .
[38] Hidekazu Mimura,et al. Second metrology round-robin of APS, ESRF and SPring-8 laboratories of elliptical and spherical hard-x-ray mirrors , 2007, SPIE Optical Engineering + Applications.
[39] Garth J. Williams,et al. Ultra-precise characterization of LCLS hard X-ray focusing mirrors by high resolution slope measuring deflectometry. , 2012, Optics express.
[40] Josep Nicolas,et al. Characterization of the error budget of Alba-NOM , 2013 .
[41] Jun Qian,et al. X-ray optics simulation and beamline design using a hybrid method: diffraction-limited focusing mirrors , 2014, Optics & Photonics - Optical Engineering + Applications.
[42] Samuel K. Barber,et al. Sub-microradian surface slope metrology with the ALS Developmental Long Trace Profiler , 2009 .
[43] Valeriy V. Yashchuk,et al. Application of the time-invariant linear filter approximation to parametrization of surface metrology with high-quality x-ray optics , 2014 .
[44] Ralf D. Geckeler. ESAD shearing deflectometry: potentials for synchrotron beamline metrology , 2006, SPIE Optics + Photonics.
[45] Xianbo Shi,et al. A hybrid method for X-ray optics simulation: combining geometric ray-tracing and wavefront propagation , 2014, Journal of synchrotron radiation.