Millimeter Wave Fabry-Perot Interferometer For The Measurement Of The Conductivity Of Thin Films For Solar Cells

The conductivity of a thin film on a metal plate can be calculated from measurements of the Q of the cavity of a Fabry-Perot interferometer and the thin film if the cavity without the film has been previously measured. The theory for the conductivity which shows a cubic dependence on the thickness of the film has been developed. The measurement system at 93 gigahertz is described. Experimental results are presented.