ELECTRONMICROSCOPY INSPIRED SETUP FOR SINGLE-SHOT 4-D TRACE SPACE RECONSTRUCTION OF BRIGHT ELECTRON BEAMS

In the development of low charge, single-shot diagnostics for high brightness electron beams, Transmission Electron Microscopy (TEM) grids present certain advantages compared to pepper pot masks due to higher beam transmission. In this paper, we developed a set of criteria to optimize the resolution of a point projection image. However, this configuration of the beam with respect to the grid and detector positions implies the measurement of a strongly correlated phase space which entails a large sensitivity to small measurement errors in retrieving the projected emittance. We discuss the possibility of an alternative scheme by inserting a magnetic focusing system in between the grid and the detector, similar to an electron microscope design, to reconstruct the phase space when the beam is focused on the grid.