Application of built in self-test for interconnect testing of FPGAs

Field Programmable Gate Arrays (FPGAs) are becoming more difficult to test due to their increasing complexity and density. Test methodologies for FPGAs consist of generating numerous configurations of programmable switches that connect wire segments to create signal flow paths. We have developed a system that takes an arbitrary FPGA interconnect network and automatically generates configurations for test. These configurations detect single stuck-at faults, pair-wise bridging faults and wire-open faults. We have modified the traditional FordFulkerson Max-Flow algorithm to enable the efficient definition of test configurations. The system also generates the bitstreams, programs the FPGA, and displays the result. We have tested a Xilinx Virtex XCV150 and have presented the number of configurations and the test time for the device.

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