Testing for resistive opens and stuck opens

This paper studies the behavior of stuck and resistive open defects. The effects on test results of three test conditions (supply voltage, speed, temperature) as well as test patterns applied are evaluated. Diagnosis schemes for stuck and resistive opens are also presented. Five Murphy chips are diagnosed as having stuck open defects and one chip is diagnosed as having a resistive open defect. Their experimental data match our expectations for stuck opens and resistive opens.

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