论文信息 - Surface versus bulk characterizations of electronic inhomogeneity in a VO2 thin film - 字舞流文

Surface versus bulk characterizations of electronic inhomogeneity in a VO2 thin film

B. Kahng | T. Noh | J.-S. Chung | D. Kim | D. Kim | Y. S. Kim | Y. Chang | O. E. | J. Yang | OH E.