Applications of X-ray diffraction in nanomaterials
暂无分享,去创建一个
[1] C. McNeill,et al. Resonant Tender X-ray Diffraction for Disclosing the Molecular Packing of Paracrystalline Conjugated Polymer Films. , 2021, Journal of the American Chemical Society.
[2] C. Mitterer,et al. Nanoscale residual stress and microstructure gradients across the cutting edge area of a TiN coating on WC Co , 2020 .
[3] L. Largeau,et al. A study of the strain distribution by scanning X-ray diffraction on GaP/Si for III–V monolithic integration on silicon , 2019, Journal of Applied Crystallography.
[4] T. Cornelius,et al. Progress of in situ synchrotron X-ray diffraction studies on the mechanical behavior of materials at small scales , 2018 .
[5] M. Burghammer,et al. 30 nm X-ray focusing correlates oscillatory stress, texture and structural defect gradients across multilayered TiN-SiOx thin film , 2018 .
[6] C. Mitterer,et al. In-situ Observation of Cross-Sectional Microstructural Changes and Stress Distributions in Fracturing TiN Thin Film during Nanoindentation , 2016, Scientific Reports.
[7] L. Largeau,et al. Abrupt GaP/Si hetero-interface using bistepped Si buffer , 2015 .
[8] J. Deng,et al. Unusual Strong Incommensurate Modulation in a Tungsten-Bronze-Type Relaxor PbBiNb5O15. , 2015, Journal of the American Chemical Society.
[9] J. Keckes,et al. Cross-sectional X-ray nano-diffraction and -reflectivity analysis of multilayered AlTiN–TiSiN thin films: Correlation between residual strain and bi-layer period , 2015 .
[10] Jie Su,et al. PKU-3: An HCl-Inclusive Aluminoborate for Strecker Reaction Solved by Combining RED and PXRD. , 2015, Journal of the American Chemical Society.
[11] V. Fiori,et al. Strain and tilt mapping in silicon around copper filled TSVs using advanced X-ray nano-diffraction , 2015 .
[12] Stephan O Hruszkewycz,et al. Strain imaging of nanoscale semiconductor heterostructures with x-ray Bragg projection ptychography. , 2014, Physical review letters.
[13] P. Boesecke,et al. Imaging of strain and lattice orientation by quick scanning X-ray microscopy combined with three-dimensional reciprocal space mapping , 2014 .
[14] S. Cecchi,et al. Dislocation engineering in SiGe on periodic and aperiodic Si(001) templates studied by fast scanning X-ray nanodiffraction , 2014 .
[15] Haydyn D. T. Mertens,et al. A low-background-intensity focusing small-angle X-ray scattering undulator beamline , 2013 .
[16] C. Zannoni,et al. On the Supramolecular Packing of High Electron Mobility Naphthalene Diimide Copolymers: The Perfect Registry of Asymmetric Branched Alkyl Side Chains , 2013 .
[17] U. Pietsch,et al. Distribution of zinc‐blende twins and wurtzite segments in GaAs nanowires probed by X‐ray nanodiffraction , 2013 .
[18] M. Burghammer,et al. Origins of microstructure and stress gradients in nanocrystalline thin films: The role of growth parameters and self-organization , 2013 .
[19] M. Burghammer,et al. X-ray nanodiffraction reveals strain and microstructure evolution in nanocrystalline thin films , 2012 .
[20] U. Pietsch,et al. Structural polytypism and residual strain in GaAs nanowires grown on Si(111) probed by single‐nanowire X‐ray diffraction , 2012 .
[21] C. M. Folkman,et al. X-ray nanodiffraction of tilted domains in a poled epitaxial BiFeO3 thin film , 2011 .
[22] L. Nanver,et al. X-ray Nanodiffraction on a Single SiGe Quantum Dot inside a Functioning Field-Effect Transistor , 2011, Nano letters.
[23] Wiebke Witte,et al. GaP-nucleation on exact Si (0 0 1) substrates for III/V device integration , 2011 .
[24] C. Mitterer,et al. The origin of stresses in magnetron-sputtered thin films with zone T structures , 2010 .
[25] A. Wakahara,et al. Lattice relaxation process and crystallographic tilt in GaP layers grown on misoriented Si(001) substrates by metalorganic vapor phase epitaxy , 2010 .
[26] Ho Won Jang,et al. Study of defect-dipoles in an epitaxial ferroelectric thin film , 2010 .
[27] E. Bourhis,et al. In situ diffraction strain analysis of elastically deformed polycrystalline thin films, and micromechanical interpretation , 2009 .
[28] A. Snigirev,et al. Two-step hard X-ray focusing combining Fresnel zone plate and single-bounce ellipsoidal capillary. , 2007, Journal of synchrotron radiation.
[29] Christian Morawe,et al. Nanofocusing at ESRF Using Graded Multilayer Mirrors , 2007 .
[30] T. Ishikawa,et al. Efficient focusing of hard x rays to 25nm by a total reflection mirror , 2007 .
[31] H. C. Kang,et al. Nanometer linear focusing of hard x rays by a multilayer Laue lens. , 2006, Physical review letters.
[32] M. Burghammer,et al. Hard X-Ray Nanoprobe based on Refractive X-Ray Lenses , 2005 .
[33] B. Lai,et al. Development of x-ray nanodiffraction instrumentation for studies of individual nano-objects , 2005 .
[34] Junliang Sun,et al. Phase Equilibrium of the In2O3−TiO2−MO (M = Ca, Sr) Systems and the Structure of In6Ti6CaO22 , 2005 .
[35] T Salditt,et al. Two-dimensional hard x-ray beam compression by combined focusing and waveguide optics. , 2005, Physical review letters.
[36] G. Bauer,et al. Structural properties of self-organized semiconductor nanostructures , 2004 .
[37] R. Peng,et al. Strain and texture analysis of coatings using high-energy x-rays , 2003 .
[38] Marcus A. Neumann,et al. X-Cell: a novel indexing algorithm for routine tasks and difficult cases , 2003 .
[39] B. Lai,et al. An X-ray diffraction microscope at the Advanced Photon Source , 2003 .
[40] B. Lai,et al. Vibration-damping structure for an x-ray microprobe supporting system , 2002 .
[41] Shenglan Xu,et al. Integration of a hard x-ray microprobe with a diffractometer for microdiffraction , 2001 .
[42] C. Kunz,et al. Synchrotron radiation: third generation sources , 2001 .
[43] C. Riekel,et al. Quantitative texture analysis of small domains with synchrotron radiation X-rays , 1999 .
[44] Steven A. Ringel,et al. Anti-phase domain-free growth of GaAs on offcut (001) Ge wafers by molecular beam epitaxy with suppressed Ge outdiffusion , 1998 .
[45] C. Genzel. Evaluation of stress gradients s̀ij(z) from their discrete laplace transforms s̀ij(τk) obtained by x-ray diffraction performed in the scattered vector mode , 1996 .
[46] D. Bilderback,et al. Nanometer spatial resolution achieved in hard x-ray imaging and Laue diffraction experiments. , 1994, Science.
[47] D. Louër,et al. Indexing of powder diffraction patterns for low-symmetry lattices by the successive dichotomy method , 1991 .
[48] Clive A. Randall,et al. Ferroelectric domain configurations in a modified-PZT ceramic , 1987 .
[49] Herbert Kroemer,et al. Polar-on-nonpolar epitaxy , 1987 .
[50] Lars Eriksson,et al. TREOR, a semi-exhaustive trial-and-error powder indexing program for all symmetries , 1985 .
[51] V. Favre-Nicolin,et al. Resonant diffraction. , 2001, Chemical reviews.
[52] Weihua Jiang,et al. Synthesis of TiO2 and TiN nanosize powders by intense light ion-beam evaporation , 1998 .
[53] A. Miller,et al. Pressure dependence of elastic behaviour and force constants of GaP , 1981 .