Applications of X-ray diffraction in nanomaterials

[1]  C. McNeill,et al.  Resonant Tender X-ray Diffraction for Disclosing the Molecular Packing of Paracrystalline Conjugated Polymer Films. , 2021, Journal of the American Chemical Society.

[2]  C. Mitterer,et al.  Nanoscale residual stress and microstructure gradients across the cutting edge area of a TiN coating on WC Co , 2020 .

[3]  L. Largeau,et al.  A study of the strain distribution by scanning X-ray diffraction on GaP/Si for III–V monolithic integration on silicon , 2019, Journal of Applied Crystallography.

[4]  T. Cornelius,et al.  Progress of in situ synchrotron X-ray diffraction studies on the mechanical behavior of materials at small scales , 2018 .

[5]  M. Burghammer,et al.  30 nm X-ray focusing correlates oscillatory stress, texture and structural defect gradients across multilayered TiN-SiOx thin film , 2018 .

[6]  C. Mitterer,et al.  In-situ Observation of Cross-Sectional Microstructural Changes and Stress Distributions in Fracturing TiN Thin Film during Nanoindentation , 2016, Scientific Reports.

[7]  L. Largeau,et al.  Abrupt GaP/Si hetero-interface using bistepped Si buffer , 2015 .

[8]  J. Deng,et al.  Unusual Strong Incommensurate Modulation in a Tungsten-Bronze-Type Relaxor PbBiNb5O15. , 2015, Journal of the American Chemical Society.

[9]  J. Keckes,et al.  Cross-sectional X-ray nano-diffraction and -reflectivity analysis of multilayered AlTiN–TiSiN thin films: Correlation between residual strain and bi-layer period , 2015 .

[10]  Jie Su,et al.  PKU-3: An HCl-Inclusive Aluminoborate for Strecker Reaction Solved by Combining RED and PXRD. , 2015, Journal of the American Chemical Society.

[11]  V. Fiori,et al.  Strain and tilt mapping in silicon around copper filled TSVs using advanced X-ray nano-diffraction , 2015 .

[12]  Stephan O Hruszkewycz,et al.  Strain imaging of nanoscale semiconductor heterostructures with x-ray Bragg projection ptychography. , 2014, Physical review letters.

[13]  P. Boesecke,et al.  Imaging of strain and lattice orientation by quick scanning X-ray microscopy combined with three-dimensional reciprocal space mapping , 2014 .

[14]  S. Cecchi,et al.  Dislocation engineering in SiGe on periodic and aperiodic Si(001) templates studied by fast scanning X-ray nanodiffraction , 2014 .

[15]  Haydyn D. T. Mertens,et al.  A low-background-intensity focusing small-angle X-ray scattering undulator beamline , 2013 .

[16]  C. Zannoni,et al.  On the Supramolecular Packing of High Electron Mobility Naphthalene Diimide Copolymers: The Perfect Registry of Asymmetric Branched Alkyl Side Chains , 2013 .

[17]  U. Pietsch,et al.  Distribution of zinc‐blende twins and wurtzite segments in GaAs nanowires probed by X‐ray nanodiffraction , 2013 .

[18]  M. Burghammer,et al.  Origins of microstructure and stress gradients in nanocrystalline thin films: The role of growth parameters and self-organization , 2013 .

[19]  M. Burghammer,et al.  X-ray nanodiffraction reveals strain and microstructure evolution in nanocrystalline thin films , 2012 .

[20]  U. Pietsch,et al.  Structural polytypism and residual strain in GaAs nanowires grown on Si(111) probed by single‐nanowire X‐ray diffraction , 2012 .

[21]  C. M. Folkman,et al.  X-ray nanodiffraction of tilted domains in a poled epitaxial BiFeO3 thin film , 2011 .

[22]  L. Nanver,et al.  X-ray Nanodiffraction on a Single SiGe Quantum Dot inside a Functioning Field-Effect Transistor , 2011, Nano letters.

[23]  Wiebke Witte,et al.  GaP-nucleation on exact Si (0 0 1) substrates for III/V device integration , 2011 .

[24]  C. Mitterer,et al.  The origin of stresses in magnetron-sputtered thin films with zone T structures , 2010 .

[25]  A. Wakahara,et al.  Lattice relaxation process and crystallographic tilt in GaP layers grown on misoriented Si(001) substrates by metalorganic vapor phase epitaxy , 2010 .

[26]  Ho Won Jang,et al.  Study of defect-dipoles in an epitaxial ferroelectric thin film , 2010 .

[27]  E. Bourhis,et al.  In situ diffraction strain analysis of elastically deformed polycrystalline thin films, and micromechanical interpretation , 2009 .

[28]  A. Snigirev,et al.  Two-step hard X-ray focusing combining Fresnel zone plate and single-bounce ellipsoidal capillary. , 2007, Journal of synchrotron radiation.

[29]  Christian Morawe,et al.  Nanofocusing at ESRF Using Graded Multilayer Mirrors , 2007 .

[30]  T. Ishikawa,et al.  Efficient focusing of hard x rays to 25nm by a total reflection mirror , 2007 .

[31]  H. C. Kang,et al.  Nanometer linear focusing of hard x rays by a multilayer Laue lens. , 2006, Physical review letters.

[32]  M. Burghammer,et al.  Hard X-Ray Nanoprobe based on Refractive X-Ray Lenses , 2005 .

[33]  B. Lai,et al.  Development of x-ray nanodiffraction instrumentation for studies of individual nano-objects , 2005 .

[34]  Junliang Sun,et al.  Phase Equilibrium of the In2O3−TiO2−MO (M = Ca, Sr) Systems and the Structure of In6Ti6CaO22 , 2005 .

[35]  T Salditt,et al.  Two-dimensional hard x-ray beam compression by combined focusing and waveguide optics. , 2005, Physical review letters.

[36]  G. Bauer,et al.  Structural properties of self-organized semiconductor nanostructures , 2004 .

[37]  R. Peng,et al.  Strain and texture analysis of coatings using high-energy x-rays , 2003 .

[38]  Marcus A. Neumann,et al.  X-Cell: a novel indexing algorithm for routine tasks and difficult cases , 2003 .

[39]  B. Lai,et al.  An X-ray diffraction microscope at the Advanced Photon Source , 2003 .

[40]  B. Lai,et al.  Vibration-damping structure for an x-ray microprobe supporting system , 2002 .

[41]  Shenglan Xu,et al.  Integration of a hard x-ray microprobe with a diffractometer for microdiffraction , 2001 .

[42]  C. Kunz,et al.  Synchrotron radiation: third generation sources , 2001 .

[43]  C. Riekel,et al.  Quantitative texture analysis of small domains with synchrotron radiation X-rays , 1999 .

[44]  Steven A. Ringel,et al.  Anti-phase domain-free growth of GaAs on offcut (001) Ge wafers by molecular beam epitaxy with suppressed Ge outdiffusion , 1998 .

[45]  C. Genzel Evaluation of stress gradients s̀ij(z) from their discrete laplace transforms s̀ij(τk) obtained by x-ray diffraction performed in the scattered vector mode , 1996 .

[46]  D. Bilderback,et al.  Nanometer spatial resolution achieved in hard x-ray imaging and Laue diffraction experiments. , 1994, Science.

[47]  D. Louër,et al.  Indexing of powder diffraction patterns for low-symmetry lattices by the successive dichotomy method , 1991 .

[48]  Clive A. Randall,et al.  Ferroelectric domain configurations in a modified-PZT ceramic , 1987 .

[49]  Herbert Kroemer,et al.  Polar-on-nonpolar epitaxy , 1987 .

[50]  Lars Eriksson,et al.  TREOR, a semi-exhaustive trial-and-error powder indexing program for all symmetries , 1985 .

[51]  V. Favre-Nicolin,et al.  Resonant diffraction. , 2001, Chemical reviews.

[52]  Weihua Jiang,et al.  Synthesis of TiO2 and TiN nanosize powders by intense light ion-beam evaporation , 1998 .

[53]  A. Miller,et al.  Pressure dependence of elastic behaviour and force constants of GaP , 1981 .