CFAR detection of weak target in clutter using chaos synchronization

An efficient algorithm is proposed for finding all DC solutions of transistor circuits where characteristics of transistors are represented by piecewise-linear (PWL) convex monotone functions. This algorithm is based on a simple test (termed the linear programming, LP, test) for non-existence of a solution to a system of PWL equations in a given region. In the conventional LP test, the system of PWL equations is transformed into an LP problem by surrounding component PWL functions by rectangles. Then the dual simplex method is applied, by which the number of pivotings per region becomes very small. In this letter, we propose a new LP test using the dual simplex method and triangles. The proposed test is not only efficient but also more powerful than the conventional test using the simplex method or rectangles. Copyright © 2008 John Wiley & Sons, Ltd.

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