Spectral Fault Signatures for Single Stuck-At Faults in Combinational Networks
暂无分享,去创建一个
[1] George Markowsky,et al. Syndrome-Testability Can be Achieved by Circuit Modification , 1981, IEEE Transactions on Computers.
[2] D. Michael Miller,et al. Spectral Fault Signatures for Internally Unate Combinational Networks , 1983, IEEE Transactions on Computers.
[3] Stanley L. Hurst. The logical processing of digital signals , 1978 .
[4] Jacob Savir,et al. Syndrome-Testing of " Syndrome-Untestable" Combinational Circuits , 1981, IEEE Transactions on Computers.
[5] Jon C. Muzio. Composite Spectra and the Analysis of Switching Circuits , 1980, IEEE Transactions on Computers.
[6] Jacob Savir,et al. Syndrome-Testable Design of Combinational Circuits , 1980, IEEE Transactions on Computers.
[7] D. M. Miller,et al. Syndrome-testable internally unate combinational networks , 1983 .
[8] Thomas W. Williams,et al. A logic design structure for LSI testability , 1977, DAC '77.
[9] Alfred K. Susskind,et al. Testing by Verifying Walsh Coefficients , 1983, IEEE Transactions on Computers.
[10] Arnold L. Rosenberg,et al. Exhaustive Generation of Bit Patterns with Applications to VLSI Self-Testing , 1983, IEEE Transactions on Computers.
[11] Melvin A. Breuer,et al. Diagnosis and Reliable Design of Digital Systems , 1977 .