Single-qubit-gate error below 10 -4 in a trapped ion

With a {sup 9}Be{sup +} trapped-ion hyperfine-state qubit, we demonstrate an error probability per randomized single-qubit gate of 2.0(2)x10{sup -5}, below the threshold estimate of 10{sup -4} commonly considered sufficient for fault-tolerant quantum computing. The {sup 9}Be{sup +} ion is trapped above a microfabricated surface-electrode ion trap and is manipulated with microwaves applied to a trap electrode. The achievement of low single-qubit-gate errors is an essential step toward the construction of a scalable quantum computer.

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