An integrated electron-beam probing environment with a simulation interface and CAD navigation

Abstract This paper describes the use of Integrated Diagnostic Assistant (IDA), a fault isolation software tool, to perform functional silicon debug. The work was done on an electron-beam (e-beam) probing system, direct docked to an automatic test equipment, or ATE. This tool is configured to accommodate National Semiconductor's mixed signal design environment in preparation for development of full analog debug capability.

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