Crop Yield Modelling Applying Leaf Area Index Estimated from Sentinel-2 and Proba-V Data at JECAM site in Poland
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Katarzyna Dabrowska-Zielinska | Alicja Malinska | Radoslaw Gurdak | Wojciech Kiryla | Maciej Bartold | Zbigniew Bochenek | Martyna Gatkowska
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