Built-in self-test

Abstract The increasing requirements of product quality and availability demand an effective discipline in quality assurance. The continuous expansion of the capabilities of new products, and the need to reduce their life-cycle cost and realization intervals add more stringent requirements to the above quality assurance needs. This paper discusses an approach consisting of a self-contained and reusable built-in hardware capability. In its basic form, this built-in solution performs built-in self-test, and can be extended to built-in self-diagnosis and built-in self-repair for reliability and availability purposes. Moreover, this discipline not only provides an effective quality assurance, but also helps reduce the life-cycle cost and the realization interval of a product.

[1]  Richard L. Campbell,et al.  Testing goes critical path , 1994, AT&T Technical Journal.

[2]  Yervant Zorian,et al.  Programmable space compaction for BIST , 1993, FTCS-23 The Twenty-Third International Symposium on Fault-Tolerant Computing.

[3]  Hans-Joachim Wunderlich,et al.  Parallel self-test and the synthesis of control units , 1991 .

[4]  Yervant Zorian,et al.  An Effective BIST Scheme for ROM's , 1992, IEEE Trans. Computers.

[5]  Yervant Zorian,et al.  Built-in self-test for digital integrated circuits , 1994, AT&T Technical Journal.

[6]  Vishwani D. Agrawal,et al.  A Tutorial on Built-in Self-Test. I. Principles , 1993, IEEE Des. Test Comput..

[7]  Yervant Zorian,et al.  Automated BIST for regular structures embedded in ASIC devices , 1990, AT&T Technical Journal.

[8]  R. L. Campbell Creating wealth—through testing? , 1992 .