Determination of the thermal diffusivity of bulk and layered samples by time domain thermoreflectance: Interest of lateral heat diffusion investigation in nanoscale time range

We report on thermal investigations performed in a time resolved experimental scheme. The time domain thermoreflectance (TDTR) is applied in an unusual geometry where the pump and probe beams are not superimposed but focused and shifted. In this way, the determination of the in-plane thermal diffusivity is achieved from temperature snapshots at different time delays. In the first part, taking into account the specific generation process and the detection inherent to the time domain thermoreflectance approach, an analytical solution for the temperature field is obtained for bulk samples, and compared to experimental data. A comparison with the frequency domain thermoreflectance microscopy is also outlined. In Part II section, the lateral heat diffusion in a layered structure is investigated. The comparison of the heat diffusion spreading in case of a highly conductive layer deposited on an insulator substrate and the reverse situation are carefully studied. Finally, we show how the time dependence is efficient to probe and identify material thermal properties or thermal interfacial resistance.

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