A Comprehensive Study of Reverse Current Degradation Mechanisms in Au/Ni/n-GaN Schottky Diodes
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Guofeng Yang | S. Xiao | D. Yan | Jian Ren | Xiaofeng Gu | Zhi-guo Yu | Wenjie Mou | Linna Zhao
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Guofeng Yang | S. Xiao | D. Yan | Jian Ren | Xiaofeng Gu | Zhi-guo Yu | Wenjie Mou | Linna Zhao