A low-offset calibration-free comparator with a mismatch-suppressed dynamic preamplifier

This paper presents a new low offset comparator with a mismatch-suppressed dynamic preamplifier Various mismatches contribute to comparators's input referred offset. The proposed mismatch suppression is achieved by sampling the mismatches at the dynamic preamplifier's output node during the precharge phase. A time-domain analysis method is utilized to quantize the suppression effects. By the techniques, a 1-GS/s four-input comparator is implemented by 65-nm CMOS technology. It achieves a 60-μW power dissipation and a 1.89-mV 1-sigma(σ) offset voltage, which is a 90% improvement compared to its non-suppressed counterparts.

[1]  Yong-Bin Kim,et al.  Offset voltage analysis of dynamic latched comparator , 2011, 2011 IEEE 54th International Midwest Symposium on Circuits and Systems (MWSCAS).

[2]  Soon-Jyh Chang,et al.  A 10-bit 50-MS/s SAR ADC With a Monotonic Capacitor Switching Procedure , 2010, IEEE Journal of Solid-State Circuits.

[3]  Robert G. Meyer,et al.  Analysis and Design of Analog Integrated Circuits , 1993 .

[4]  Y. Sonobe,et al.  Impact of reducing STI-induced stress on layout dependence of MOSFET characteristics , 2004, IEEE Transactions on Electron Devices.

[5]  P ? ? ? ? ? ? ? % ? ? ? ? , 1991 .

[6]  Rui Paulo Martins,et al.  A 2.3mW 10-bit 170MS/s two-step binary-search assisted time-interleaved SAR ADC , 2012, Proceedings of the IEEE 2012 Custom Integrated Circuits Conference.