Planarization of substrate surface by means of ultrathin diamond-like carbon film
暂无分享,去创建一个
[1] Alexander Baranov,et al. Real-time monitoring of diamond-like film growth by x-ray diffraction , 1995, Optics & Photonics.
[2] Eberhard Spiller. Enhancement of the reflectivity of multilayer x-ray mirrors by ion polishing , 1990 .
[3] Yeshayahu Lifshitz,et al. Hydrogen-free amorphous carbon films: correlation between growth conditions and properties , 1996 .
[4] M. Lagally,et al. Interfacial roughness correlation in multilayer films: Influence of total film and individual layer thicknesses , 1992 .
[5] Eberhard Spiller,et al. Soft-x-ray optics , 1994, Optical Society of America Annual Meeting.
[6] A. Baranov,et al. X‐ray Monitoring System for in situ Investigation of Thin Film Growth , 1995 .
[7] Alexander Baranov,et al. Investigation of superthin carbon layers and multilayer carbon structures by x-ray reflectivity measurements , 1996, Optics & Photonics.