论文信息 - Moiré interferometry at VPI & SU

Moiré interferometry at VPI & SU

A relatively easy technique for producing high-frequency gratings on specimens extends moiré techniques into the high-sensitivity domain. Whole-field patterns of inplane displacement components are obtained with grating frequencies of 1200, 2400 and 4000 l/mm (30,480, 60,960 and 101,600 l/in.). Moiré interferometry is a case of two-beam interference, characterized by extensive range, excellent fringe contrast and fringe localization on the specimen surface. It is a reflection technique, compatible with opaque specimens and live observation of deformation.

Daniel Post | D. Post

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